Dynamical analysis of the buildup process near resonance

AI-generated keywords: Double-barrier system Off-resonance incidence energies Time-dependent Schrödinger equation Oscillatory pattern Transient regime

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  • Villavicencio and Romo investigate the time evolution of the buildup process inside a double-barrier system for off-resonance incidence energies
  • They consider the analytic solution of the time-dependent Schrödinger equation with cutoff plane wave initial conditions to study this phenomenon
  • The buildup process exhibits invariances under arbitrary changes on the system parameters, which can be successfully described by a simple and easy-to-use one-level formula
  • The buildup of off-resonant probability density is characterized by an oscillatory pattern modulated by the resonant case, which governs the duration of the transient regime
  • Off-resonant and resonant tunneling are two correlated processes whose transient regime is characterized by the same transient time constant of two lifetimes
  • This study provides valuable insights into how double-barrier systems behave under different conditions, shedding light on important phenomena such as tunneling and quantum mechanics
  • The authors' findings could have implications for a range of fields including materials science, electronics, and quantum computing.
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Authors: Jorge Villavicencio (Centro de Investigacion Cientifica y de Educacion Superior de Ensenada, Ensenada Baja California, Mexico), Roberto Romo (Facultad de Ciencias, Universida Autonoma de Baja California, Ensenada, Baja California, Mexico)

Appl. Phys. Lett. Vol. 77, No. 3, 379 (2000)
3 pages, 4 figures

Abstract: The time evolution of the buildup process inside a double-barrier system for off-resonance incidence energies is studied by considering the analytic solution of the time dependent Schr\"{o}dinger equation with cutoff plane wave initial conditions. We show that the buildup process exhibits invariances under arbitrary changes on the system parameters, which can be successfully described by a simple and easy-to-use one-level formula. We find that the buildup of the off-resonant probability density is characterized by an oscillatory pattern modulated by the resonant case which governs the duration of the transient regime. This is evidence that off-resonant and resonant tunneling are two correlated processes, whose transient regime is characterized by the same transient time constant of two lifetimes.

Submitted to arXiv on 09 Nov. 2000

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Results of the summarizing process for the arXiv paper: quant-ph/0011032v1

This paper's license doesn't allow us to build upon its content and the summarizing process is here made with the paper's metadata rather than the article.

In their paper "Dynamical analysis of the Buildup Process near Resonance," Jorge Villavicencio and Roberto Romo investigate the time evolution of the buildup process inside a double-barrier system for off-resonance incidence energies. They consider the analytic solution of the time-dependent Schrödinger equation with cutoff plane wave initial conditions to study this phenomenon. The authors find that the buildup process exhibits invariances under arbitrary changes on the system parameters, which can be successfully described by a simple and easy-to-use one-level formula. The authors also observe that the buildup of off-resonant probability density is characterized by an oscillatory pattern modulated by the resonant case, which governs the duration of the transient regime. This finding suggests that off-resonant and resonant tunneling are two correlated processes whose transient regime is characterized by the same transient time constant of two lifetimes. Overall, this study provides valuable insights into how double-barrier systems behave under different conditions, shedding light on important phenomena such as tunneling and quantum mechanics. The authors' findings could have implications for a range of fields including materials science, electronics, and quantum computing.
Created on 03 Jun. 2023

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