Investigating the image lag of a scientific CMOS sensor in X-ray detection
AI-generated Key Points
- Scientific CMOS (sCMOS) sensors have outperformed CCDs in higher readout frame rate, radiation tolerance, and working temperature.
- Image lag can occur when charges of an event are not fully transferred inside pixels, degrading image quality for optical imaging and energy resolution for X-ray spectroscopy.
- A new method was constructed to extract image lag from X-ray photons using a customized X-ray sCMOS sensor GSENSE1516BSI.
- The image lag of this sensor exists only in the immediately subsequent frame and is always less than 0.05% for different incident photon energies and under different experimental conditions.
- The residual charge was smaller than 0.5 e-, which is too small to have a significant impact on imaging quality or energy resolution compared to the readout noise level around 3 e-.
- The image lag showed a positive correlation with incident photon energy and a negative correlation with temperature but had no dependence on gain setting or integration time.
- Experiments were carried out with different gain settings and integration times ranging from -30°C to 20°C under vacuum conditions around 10^-3 Pa while controlling count rate to about 20000 counts per frame to make sure that each pixel occupancy remained below 0.2%.
- The measurement method involved calculating an averaged background image from dark exposures under each experimental condition and processing X-ray exposure data frame by frame.
Authors: Qinyu Wu, Zhixing Ling, Chen Zhang, Quan Zhou, Xinyang Wang, Weimin Yuan, Shuang-Nan Zhang
Abstract: In recent years, scientific CMOS (sCMOS) sensors have been vigorously developed and have outperformed CCDs in several aspects: higher readout frame rate, higher radiation tolerance, and higher working temperature. For silicon image sensors, image lag will occur when the charges of an event are not fully transferred inside pixels. It can degrade the image quality for optical imaging, and deteriorate the energy resolution for X-ray spectroscopy. In this work, the image lag of a sCMOS sensor is studied. To measure the image lag under low-light illumination, we constructed a new method to extract the image lag from X-ray photons. The image lag of a customized X-ray sCMOS sensor GSENSE1516BSI is measured, and its influence on X-ray performance is evaluated. The result shows that the image lag of this sensor exists only in the immediately subsequent frame and is always less than 0.05% for different incident photon energies and under different experimental conditions. The residual charge is smaller than 0.5 e- with the highest incident photon charge around 8 ke-. Compared to the readout noise level around 3 e-, the image lag of this sensor is too small to have a significant impact on the imaging quality and the energy resolution. The image lag shows a positive correlation with the incident photon energy and a negative correlation with the temperature. However, it has no dependence on the gain setting and the integration time. These relations can be explained qualitatively by the non-ideal potential structure inside the pixels. This method can also be applied to the study of image lag for other kinds of imaging sensors.
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